RS232 Interface Clamp on Earth Resistance Tester

  • Model NO.: L745 HZRC300
  • Control: Manual Control
  • Power Source: 6VDC 4 PCS of AA Alkaline Batteries
  • Measuring Voltage Range: 15V/100V/300V/600V
  • Measuring Capacitance Range: 40Hz~100kHz
  • Reactive Power: 0.01kvar-600kvar
  • Transport Package: Carton Box with Foam Inside
  • HS Code: 9030339000
  • Display: Digital
  • Weight: 1160g
  • Measuring Current Range: 0.0--20.0
  • Measuring Resistance Range: 0.01--1200
  • Measuring Inductance Range: 9.999Hz~9.999MHz
  • Trademark: Huadian
  • Origin: Dongguan China
RS232 interface Clamp on Earth Resistance Tester
RS232 Interface Clamp on Earth Resistance Tester

Clamp On Earth Resistance Tester  is widely applied in ground resistance measurement, loop resistance measurement in fields such as electric power, telecommunications, meteorology, oil field, architecture and industrial electrical equipment, etc. When measuring ground system with loop, there is no need to disconnect the ground wire without auxiliary electrode, which means safer and faster. Clamp Earth Resistance Tester can measure the ground fault which can not be measured by traditional method, can apply in the occasion where traditional methods are unworkable; Clamp Earth Resistance Tester measures the integrated value of ground resistance and resistance lead.RS232 Interface Clamp on Earth Resistance Tester

1.Main Technical Specifications

Resistance Range

0.01-1200Ω

Resistance Resolution

0.001Ω

Highest Resistance Accuracy

±1%±0.01Ω

Alarm Threshold Setting Range

Resistance: 1-199Ω

Alarm Sound and Light

"Beep-beep-beep" alarm tone, Alarm Symbol Flashing, Press AL key to turn on, turn off Alarm or set Alarm Threshold.

Interference Signal Recognition

"Beep-beep-beep" tone, NOISE symbol blinking

Working Temperature and Humidity

-20°C-55°C;20%RH-90%RH

LCD Screen

4 Digits LCD display, Screen L×W: 47mm×28.5mm

Clamp Size

65mm×32mm

Tester Weight

1160g (With batteries)

 

Clamp Dimension

 

L×W×T: 285mm×85mm×56mm

 

Protection Level

 

Dual Insulation

 

Structural Feature

 

Clamp CT

 

Shifting

 

Automatic shifting

 

External magnetic field

 

<40A/m

 

External electrical field

 

<1V/m

 

Single measurement time

 

0.5 second

 

Resistance measurement frequency

 

>1KHz

 

Measured current frequency

 

50/60Hz Automatic measurement

 

Low Battery Indication

 

Low battery symbol displays when battery is lower then 5.3V

 

Memory Full Indication

 

MEM symbol blinks when all 99 sets memory is full

 

Over Range Indication

 

Out of range indication "OLΩ", "L0.01" or "OL A"

 

Auto Power-off

 

5 minutes after Boot up

 

Power Consumption

 

Max 50mA either in booting up or normally working, Continuously working for 30 hours

 

RS232 Interface (Optional)

 

The data stored in the meter are uploaded to the computer through RS232 interface and data wire, Then generate report files

 

Safety Provisions

 

IEC1010-1, IEC1010-2-032, Pollution level 2, CAT III(600V)

 

Accessories

 

Meter: 1 piece, Test ring: 1 Piece, Meter Suitcase: 1 Piece

RS232 Interface Clamp on Earth Resistance Tester
 


The formation of fluoride crystal mica is a sub-grade, and does not adsorb impurities. It was selected by the Chinese Academy of Sciences Environmental Biology Research Center Peking University, Tsinghua University, Shanghai Fudan University, Nanjing University, and more than 100 national research institutions and universities for Afm Substrate After (microscopy carrier wave), the relevant person said: Compared to natural mica, fluorite mica has better flatness and less adsorption impurities. The images observed in the analysis of the DNA structure, especially in the 1 nm to 100 nm scale, have observed surface interference fringes not found in the natural mica experiment, which are clearly dozens of times better than the natural mica Substrate. Experts involved in the experiment believe that the use of fluoride mica instead of natural mica as a substrate material is expected to catch up with the international level.

The main performance in the field of atomic force microscopy:

Beijing University of Technology, Zhejiang University, Shanghai Jiaotong University, Xi'an Jiaotong University, Harbin Institute of Technology, Jilin University, Northeast Normal University, Shaanxi Normal University, Sichuan University, China University of Science and Technology, Chongqing University, Tongji University, Shenzhen University

Substrate

Microscope Substrate,Afm Substrate,Growth Substrate,Multilayer Substrate

Changchun City Taiyuan FluorphlogopiteCo. Ltd. , https://www.micaslice.com